Quality/MeeGo1.2HandSetUXTestPlanforSystemNFT

Revision as of 07:57, 2 December 2010

MeeGo 1.2 HandSet UX Test Plan for System Non-Functional Test Plan

Component Summary

Features To Be Tested

Features Not To Be Tested

Strategy and Approach

Non-functional testing (NFT) can be divided in higher level to two different areas: performance and reliability testing. MeeGo release will be tested in different NFT test sets both from performance and reliability perspective. Test areas that will be used:

• Performance testing
  • Power Management
    • Measuring (average) current consumption of the device during a use case / over a period of time
  • Data Throughput
    • The (average) rate of successful message delivery over a communication channel in a given period of time
  • Response Time
    • Response time testing measures the time a system takes to react to given input by end-user; the total time it takes from a user request until response is received
  • Memory Consumption
    • Amount of (RAM) memory used during a use case or over a period of time
  • Performance Snapshot
    • The purpose of Non-Functional performance snapshot is to give a clear and immediate overview of the software being tested in terms of non-functional errors and efficiency from end user perspective. Test set is consisting of couple test cases from all performance areas defined above
• Reliability testing
  • Aging
    • Measures the effect of long term usage for SW reliability and performance
  • Iterative
    • Performing multiple iterations of the same test case in order to expose possible problems in sequential runs

Hardware Platforms

• All official supported HW's

QA Contact

• Anssi Takku