Contents 1 Meego 1.2 Settings test plan 1.1 History 1.2 Summary 1.3 Feature to be Tested 1.4 Feature not to be Tested 1.5 Test Strategy and Approach 1.5.1 Functional test 1.5.2 Negative test 1.5.3 Stress test 1.5.4 I18N/L10N test

Meego 1.2 Settings test plan

History

Date	Comments
2010-12-03	This document was created

Summary

MeeGo Settings is a package of application applets; each applet is for a specific functionality, such as WIFI setting, Bluetooth setting, date and time setting, language setting, etc

Feature to be Tested

Features listed here are abstracted from MeeGo handset settings 1.2 Featurezilla. Settings test will cover all these features which testability is yes. And this test plan will also cover features which are not listed in Featurezilla, such as negative test, stress test.
Settings is GUI application and all functionality is exposed to user via GUI, usage models and related UI interface has top priority, and will be tested in all formal and regular testing process, basic feature test case are from it. For other scenarios (negtive, stress), make them low priority in testing circle and marked as extended feature test

Feature ID	Feature	Priority	Comments
5755	[FEA] Control Panel - Device time and date setting	Hig
5756	[FEA] Control Panel - Device time and date format setting	Hig
5758	[FEA] Control Panel - Network Operator Time	Hig
5759	[FEA] Control Panel - Network Time Protocol	Hig
5760	[FEA] Control Panel - Display and light control	Hig
5761	[FEA] Control Panel - Display and light manual control	Hig
5762	[FEA] Control Panel - Keyboard backlight and LEDs control	Hig
5763	[FEA] Control Panel - Display and light control power saving	Hig
5764	[FEA] Control Panel - Display calibration	Hig
5766	[FEA] Control Panel - About the device	Hig
5767	[FEA] Control Panel - Language & region	Hig
5768	[FEA] Control Panel - Reset Factory Settings	Hig
5769	[FEA] Control Panel - Erase and reset device	Hig
5770	[FEA] Control Panel - USB behaviour	Hig
5772	[FEA] Control Panel - Wallpaper & theme	Hig
5774	[FEA] Control Panel - Sounds	Hig
5775	[FEA] Control Panel - Location	Hig
5776	[FEA] Control Panel - Input methods	Hig
5777	[FEA] Control Panel - Memory	Hig
9258	[FEA] [I18N] Settings shall be internationalized according to the dependencies listed in Core Master 5068.	Hig

Feature not to be Tested

• All SyncUI related features are covered in SyncUI test plan
• Telephony related features are covered in telephony setting test plan
• Input method setting is covered in virtual keyboard test plan
• This document covers only 1.2 features, for 1.1 features, please reference MeeGo setting 1.1 test plan.

Test Strategy and Approach

Functional test

All basic settings usage model are covered in functional test

• check if each setting applet is integrated
• check if each setting applet could work properly (for more details see test design section)

Negative test

Negative test will use different malformed input to test the behavior of settings. For each setting applet, there are many fields to be filled, so negative test is an important part for settings test The malformed input includes:

• Very short and long string
• Special character in string
• Input non-number in number filed
• Incorrect date format
• Incorrect IP address

Stress test

Stress test focuses on testing beyond normal operational capacity, such as

• Open and close each setting applet very frequently, and check whether it could be opened and closed properly each time.

I18N/L10N test

This is localization test. We will set another language environment (such as Chinese Simplified) instead of default English environment and check whether the change applied to each setting applet.